selftests: bpf: adjust several test_verifier helpers for insn insertion

- bpf_fill_ld_abs_vlan_push_pop:
    Prevent zext happens inside PUSH_CNT loop. This could happen because
    of BPF_LD_ABS (32-bit def) + BPF_JMP (64-bit use), or BPF_LD_ABS +
    EXIT (64-bit use of R0). So, change BPF_JMP to BPF_JMP32 and redefine
    R0 at exit path to cut off the data-flow from inside the loop.

  - bpf_fill_jump_around_ld_abs:
    Jump range is limited to 16 bit. every ld_abs is replaced by 6 insns,
    but on arches like arm, ppc etc, there will be one BPF_ZEXT inserted
    to extend the error value of the inlined ld_abs sequence which then
    contains 7 insns. so, set the dividend to 7 so the testcase could
    work on all arches.

  - bpf_fill_scale1/bpf_fill_scale2:
    Both contains ~1M BPF_ALU32_IMM which will trigger ~1M insn patcher
    call because of hi32 randomization later when BPF_F_TEST_RND_HI32 is
    set for bpf selftests. Insn patcher is not efficient that 1M call to
    it will hang computer. So , change to BPF_ALU64_IMM to avoid hi32
    randomization.

Signed-off-by: Jiong Wang <jiong.wang@netronome.com>
Signed-off-by: Alexei Starovoitov <ast@kernel.org>