platform/x86/intel/ifs: Gen2 Scan test support

mainline inclusion
from mainline-v6.7-rc1
commit 72b96ee29ed6f7670bbb180ba694816e33d361d1
category: feature
bugzilla: https://gitee.com/openeuler/intel-kernel/issues/I8RCIK
CVE: N/A
Reference: https://git.kernel.org/pub/scm/linux/kernel/git/torvalds/linux.git/commit/?id=72b96ee29ed6f7670bbb180ba694816e33d361d1



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Intel-SIG: commit 72b96ee29ed6 ("platform/x86/intel/ifs: Gen2 Scan test support")
Backport to support IFS SAF & Array BIST on GNR & SRF

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Width of chunk related bitfields is ACTIVATE_SCAN and SCAN_STATUS MSRs
are different in newer IFS generation compared to gen0.

Make changes to scan test flow such that MSRs are populated
appropriately based on the generation supported by hardware.

Account for the 8/16 bit MSR bitfield width differences between gen0 and
newer generations for the scan test trace event too.

Signed-off-by: Jithu Joseph <jithu.joseph@intel.com>
Reviewed-by: Tony Luck <tony.luck@intel.com>
Reviewed-by: Ilpo Järvinen <ilpo.jarvinen@linux.intel.com>
Tested-by: Pengfei Xu <pengfei.xu@intel.com>
Link: https://lore.kernel.org/r/20231005195137.3117166-5-jithu.joseph@intel.com


Signed-off-by: Ilpo Järvinen <ilpo.jarvinen@linux.intel.com>
Signed-off-by: Aichun Shi <aichun.shi@intel.com>