Commit 2a852fbe authored by Greg Kroah-Hartman's avatar Greg Kroah-Hartman
Browse files

Merge tag 'iio-for-5.20b' of... 

Merge tag 'iio-for-5.20b' of https://git.kernel.org/pub/scm/linux/kernel/git/jic23/iio into char-misc-next

Jonathan writes:

2nd set of IIO new device support, cleanup etc for 5.20

Given the slight delay in the likely start of the merge cycle lets get
a few more things in for IIO.  A few late breaking fixes also included.
Bulk in number of patches is mechanical conversion to new PM macros.

New device support
* npcm
  - Add support for NPCM8XX with different resolution and voltage references
    from previously supported parts.

Tree wide
* pm_ptr()/pm_sleep_ptr()/DEFINE_[SIMPLE/RUNTIME]_DEV_PM_OPS() conversions
  - Convert all the low hanging fruit to the new macros. The remaining
    cases will need more careful consideration.

Tidy-up, fixes and minor features.
* Documentation
  - Fix duplicate ABI definitions and a missing blank line to squash all
    remaining docs build issues in IIO.
* core
  - Make iio_format_avail_range() handle non IIO_VAL_INT cases.
* core/trigger
  - Move the setup of trigger->owner to allocation rather than registration.
    There doesn't seem to be any advantage in doing this late and a few bugs
    have occurred because of mis-balanced module reference counting.
  - coding style fix-ups.
* tests
  - Allow kunit tests to be built as a module.
* ad7949
  - Fix a reversed error message.
* cio-dac
  - Use structures for register map to improve readability.
* cros_ec
  - Register fifo callback only after the sensor is registered. Closes
    a theoretical race.
* hmc5843
  - Duplicate word fix.
* isl29028
  - Fix mixed devm_ and non devm_ for iio_device_register().
* max1027
  - Fix missing unlocks in error paths.
* rm3100
  - Let core code handle setting INDIO_BUFFER_TRIGGERED.
* sca3000
  - Fix ordering and buffer size issue.
* sx_common
  - Don't use the IIO device to get device properties when the parent struct
    device is readily available.
  - Allow the IIO core to connect up the firmware node.
* stx104
  - Use structures for register map to improve readability.
* vf610-adc
  - Add compatible entries for imx6ul and imx6sx with fallback to
    fsl,vf610-adc.

* tag 'iio-for-5.20b' of https://git.kernel.org/pub/scm/linux/kernel/git/jic23/iio: (65 commits)
  dt-bindings: iio: adc: Add compatible for MT8188
  iio: light: isl29028: Fix the warning in isl29028_remove()
  iio: accel: sca3300: Extend the trigger buffer from 16 to 32 bytes
  iio: fix iio_format_avail_range() printing for none IIO_VAL_INT
  iio: adc: max1027: unlock on error path in max1027_read_single_value()
  iio: proximity: sx9324: add empty line in front of bullet list
  iio: magnetometer: hmc5843: Remove duplicate 'the'
  iio: magn: yas530: Use DEFINE_RUNTIME_DEV_PM_OPS() and pm_ptr() macros
  iio: magnetometer: ak8974: Use DEFINE_RUNTIME_DEV_PM_OPS() and pm_ptr() macros
  iio: light: veml6030: Use DEFINE_RUNTIME_DEV_PM_OPS() and pm_ptr() macros
  iio: light: vcnl4035: Use DEFINE_RUNTIME_DEV_PM_OPS() and pm_ptr() macros
  iio: light: vcnl4000: Use DEFINE_RUNTIME_DEV_PM_OPS() and pm_ptr() macros
  iio: light: tsl2591: Use DEFINE_RUNTIME_DEV_PM_OPS() and pm_ptr()
  iio: light: tsl2583: Use DEFINE_RUNTIME_DEV_PM_OPS and pm_ptr()
  iio: light: isl29028: Use DEFINE_RUNTIME_DEV_PM_OPS() and pm_ptr()
  iio: light: gp2ap002: Switch to DEFINE_RUNTIME_DEV_PM_OPS and pm_ptr()
  iio: adc: imx8qxp: Switch to DEFINE_RUNTIME_DEV_PM_OPS and pm_ptr()
  iio: light: us5182: Switch from CONFIG_PM guards to pm_ptr() etc
  iio: temperature: ltc2983: Switch to DEFINE_SIMPLE_DEV_PM_OPS() and pm_sleep_ptr()
  iio: proximity: cros_ec_mkbp: Switch to DEFINE_SIMPLE_DEV_PM_OPS() and pm_sleep_ptr()
  ...
parents fe5fc987 180c6cb6

Documentation/ABI/testing/sysfs-bus-iio

+3 −0
Original line number Diff line number Diff line
@@ -107,6 +107,9 @@ Description: 
		relevant directories.  If it affects all of the above

		then it is to be found in the base device directory.



		The stm32-timer-trigger has the additional characteristic that

		a sampling_frequency of 0 is defined to stop sampling.



What:		/sys/bus/iio/devices/iio:deviceX/sampling_frequency_available

What:		/sys/bus/iio/devices/iio:deviceX/in_intensity_sampling_frequency_available

What:		/sys/bus/iio/devices/iio:deviceX/in_proximity_sampling_frequency_available

Documentation/ABI/testing/sysfs-bus-iio-sx9324

+1 −0
Original line number Diff line number Diff line
@@ -5,6 +5,7 @@ Contact: Gwendal Grignou <gwendal@chromium.org> 
Description:

		SX9324 has 3 inputs, CS0, CS1 and CS2. Hardware layout

		defines if the input is



		+ not connected (HZ),

		+ grounded (GD),

		+ connected to an antenna where it can act as a base

Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856

deleted100644 → 0
+0 −31
Original line number Diff line number Diff line 
What:		/sys/bus/iio/devices/iio:deviceX/fault_oc

KernelVersion:	5.1

Contact:	linux-iio@vger.kernel.org

Description:

		Open-circuit fault. The detection of open-circuit faults,

		such as those caused by broken thermocouple wires.

		Reading returns either '1' or '0'.



		===  =======================================================

		'1'  An open circuit such as broken thermocouple wires

		     has been detected.

		'0'  No open circuit or broken thermocouple wires are detected

		===  =======================================================



What:		/sys/bus/iio/devices/iio:deviceX/fault_ovuv

KernelVersion:	5.1

Contact:	linux-iio@vger.kernel.org

Description:

		Overvoltage or Undervoltage Input Fault. The internal circuitry

		is protected from excessive voltages applied to the thermocouple

		cables by integrated MOSFETs at the T+ and T- inputs, and the

		BIAS output. These MOSFETs turn off when the input voltage is

		negative or greater than VDD.



		Reading returns either '1' or '0'.



		===  =======================================================

		'1'  The input voltage is negative or greater than VDD.

		'0'  The input voltage is positive and less than VDD (normal

		     state).

		===  =======================================================

Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865→Documentation/ABI/testing/sysfs-bus-iio-thermocouple

+18 −0
Original line number Diff line number Diff line 
What:		/sys/bus/iio/devices/iio:deviceX/fault_ovuv

KernelVersion:	5.11

KernelVersion:	5.1

Contact:	linux-iio@vger.kernel.org

Description:

		Overvoltage or Undervoltage Input fault. The internal circuitry

		Overvoltage or Undervoltage Input Fault. The internal circuitry

		is protected from excessive voltages applied to the thermocouple

		cables at FORCE+, FORCE2, RTDIN+ & RTDIN-. This circuitry turn

		off when the input voltage is negative or greater than VDD.

		cables. The device can also detect if such a condition occurs.



		Reading returns '1' if input voltage is negative or greater

		than VDD, otherwise '0'.



What:		/sys/bus/iio/devices/iio:deviceX/in_filter_notch_center_frequency

KernelVersion:	5.11

What:		/sys/bus/iio/devices/iio:deviceX/fault_oc

KernelVersion:	5.1

Contact:	linux-iio@vger.kernel.org

Description:

		Notch frequency in Hz for a noise rejection filter. Used i.e for

		line noise rejection.



		Valid notch filter values are 50 Hz and 60 Hz.
 
		Open-circuit fault. The detection of open-circuit faults,

		such as those caused by broken thermocouple wires.

		Reading returns '1' if fault, '0' otherwise.

Documentation/ABI/testing/sysfs-bus-iio-timer-stm32

+0 −8
Original line number Diff line number Diff line
@@ -90,14 +90,6 @@ Description: 
		Reading returns the current master modes.

		Writing set the master mode



What:		/sys/bus/iio/devices/triggerX/sampling_frequency

KernelVersion:	4.11

Contact:	benjamin.gaignard@st.com

Description:

		Reading returns the current sampling frequency.

		Writing an value different of 0 set and start sampling.

		Writing 0 stop sampling.



What:		/sys/bus/iio/devices/iio:deviceX/in_count0_preset

KernelVersion:	4.12

Contact:	benjamin.gaignard@st.com