Unverified Commit f3982616 authored by RAJKIRAN NATARAJAN's avatar RAJKIRAN NATARAJAN Committed by GitHub
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Merge pull request #2449 from saskatchewancatch:issue-16736

* issue-16736: quick step towards moving SIFT from non-free to free. Moves
include, tests, and implementation to free area.
parent 9c0ae273
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+33 −0
Original line number Diff line number Diff line
@@ -65,6 +65,39 @@ namespace cv
namespace xfeatures2d
{


/** @brief Class for extracting keypoints and computing descriptors using the Scale Invariant Feature Transform
(SIFT) algorithm by D. Lowe @cite Lowe04 .
*/
class CV_EXPORTS_W SIFT : public Feature2D
{
public:
    /**
    @param nfeatures The number of best features to retain. The features are ranked by their scores
    (measured in SIFT algorithm as the local contrast)

    @param nOctaveLayers The number of layers in each octave. 3 is the value used in D. Lowe paper. The
    number of octaves is computed automatically from the image resolution.

    @param contrastThreshold The contrast threshold used to filter out weak features in semi-uniform
    (low-contrast) regions. The larger the threshold, the less features are produced by the detector.

    @param edgeThreshold The threshold used to filter out edge-like features. Note that the its meaning
    is different from the contrastThreshold, i.e. the larger the edgeThreshold, the less features are
    filtered out (more features are retained).

    @param sigma The sigma of the Gaussian applied to the input image at the octave \#0. If your image
    is captured with a weak camera with soft lenses, you might want to reduce the number.
    */
    CV_WRAP static Ptr<SIFT> create(int nfeatures = 0, int nOctaveLayers = 3,
        double contrastThreshold = 0.04, double edgeThreshold = 10,
        double sigma = 1.6);
};

typedef SIFT SiftFeatureDetector;
typedef SIFT SiftDescriptorExtractor;


//! @addtogroup xfeatures2d_experiment
//! @{

+0 −34
Original line number Diff line number Diff line
@@ -50,40 +50,6 @@ namespace cv
namespace xfeatures2d
{

//! @addtogroup xfeatures2d_nonfree
//! @{

/** @brief Class for extracting keypoints and computing descriptors using the Scale Invariant Feature Transform
(SIFT) algorithm by D. Lowe @cite Lowe04 .
 */
class CV_EXPORTS_W SIFT : public Feature2D
{
public:
    /**
    @param nfeatures The number of best features to retain. The features are ranked by their scores
    (measured in SIFT algorithm as the local contrast)

    @param nOctaveLayers The number of layers in each octave. 3 is the value used in D. Lowe paper. The
    number of octaves is computed automatically from the image resolution.

    @param contrastThreshold The contrast threshold used to filter out weak features in semi-uniform
    (low-contrast) regions. The larger the threshold, the less features are produced by the detector.

    @param edgeThreshold The threshold used to filter out edge-like features. Note that the its meaning
    is different from the contrastThreshold, i.e. the larger the edgeThreshold, the less features are
    filtered out (more features are retained).

    @param sigma The sigma of the Gaussian applied to the input image at the octave \#0. If your image
    is captured with a weak camera with soft lenses, you might want to reduce the number.
     */
    CV_WRAP static Ptr<SIFT> create( int nfeatures = 0, int nOctaveLayers = 3,
                                    double contrastThreshold = 0.04, double edgeThreshold = 10,
                                    double sigma = 1.6);
};

typedef SIFT SiftFeatureDetector;
typedef SIFT SiftDescriptorExtractor;

/** @brief Class for extracting Speeded Up Robust Features from an image @cite Bay06 .

The algorithm parameters:
+0 −11
Original line number Diff line number Diff line
@@ -114,8 +114,6 @@ namespace cv
namespace xfeatures2d
{

#ifdef OPENCV_ENABLE_NONFREE

/*!
 SIFT implementation.

@@ -1202,14 +1200,5 @@ void SIFT_Impl::detectAndCompute(InputArray _image, InputArray _mask,
    }
}

#else // ! #ifdef OPENCV_ENABLE_NONFREE
Ptr<SIFT> SIFT::create( int, int, double, double, double )
{
    CV_Error(Error::StsNotImplemented,
        "This algorithm is patented and is excluded in this configuration; "
        "Set OPENCV_ENABLE_NONFREE CMake option and rebuild the library");
}
#endif

}
}
+5 −4
Original line number Diff line number Diff line
@@ -987,13 +987,13 @@ void CV_DescriptorMatcherTest::run( int )
 * Detectors
 */

#ifdef OPENCV_ENABLE_NONFREE
TEST( Features2d_Detector_SIFT, regression )
{
    CV_FeatureDetectorTest test( "detector-sift", SIFT::create() );
    test.safe_run();
}

#ifdef OPENCV_ENABLE_NONFREE
TEST( Features2d_Detector_SURF, regression )
{
    CV_FeatureDetectorTest test( "detector-surf", SURF::create() );
@@ -1028,7 +1028,6 @@ TEST( Features2d_Detector_Harris_Laplace_Affine, regression )
/*
 * Descriptors
 */
#ifdef OPENCV_ENABLE_NONFREE
TEST( Features2d_DescriptorExtractor_SIFT, regression )
{
    CV_DescriptorExtractorTest<L1<float> > test( "descriptor-sift", 1.0f,
@@ -1036,6 +1035,7 @@ TEST( Features2d_DescriptorExtractor_SIFT, regression )
    test.safe_run();
}

#ifdef OPENCV_ENABLE_NONFREE
TEST( Features2d_DescriptorExtractor_SURF, regression )
{
#ifdef HAVE_OPENCL
@@ -1334,8 +1334,9 @@ protected:
    Ptr<Feature2D> f2d;
};

#ifdef OPENCV_ENABLE_NONFREE
TEST(Features2d_SIFTHomographyTest, regression) { CV_DetectPlanarTest test("SIFT", 80, SIFT::create()); test.safe_run(); }

#ifdef OPENCV_ENABLE_NONFREE
TEST(Features2d_SURFHomographyTest, regression) { CV_DetectPlanarTest test("SURF", 80, SURF::create()); test.safe_run(); }
#endif

@@ -1400,13 +1401,13 @@ protected:
    Ptr<FeatureDetector> featureDetector_;
};

#ifdef OPENCV_ENABLE_NONFREE
TEST(Features2d_SIFT_using_mask, regression)
{
    FeatureDetectorUsingMaskTest test(SIFT::create());
    test.safe_run();
}

#ifdef OPENCV_ENABLE_NONFREE
TEST(DISABLED_Features2d_SURF_using_mask, regression)
{
    FeatureDetectorUsingMaskTest test(SURF::create());