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platform/x86/intel/ifs: Classify error scenarios correctly
mainline inclusion from mainline-v6.10-rc1 commit 02153e5dcb361d4a8538363362d78e3a88adf6ee category: feature bugzilla: https://gitee.com/openeuler/intel-kernel/issues/IASVRQ CVE: N/A Reference: https://git.kernel.org/pub/scm/linux/kernel/git/torvalds/linux.git/commit/?id=02153e5dcb361d4a8538363362d78e3a88adf6ee ------------------------------------- "Scan controller error" means that scan hardware encountered an error prior to doing an actual test on the target CPU. It does not mean that there is an actual cpu/core failure. "scan signature failure" indicates that the test result on the target core did not match the expected value and should be treated as a cpu failure. Current driver classifies both these scenarios as failures. Modify the driver to classify this situation with a more appropriate "untested" status instead of "fail" status. Intel-SIG: commit 02153e5dcb36 platform/x86/intel/ifs: Classify error scenarios correctly Backport to support IFS(In Field Scan) SBAF(Structural Based Functional Test at Field) Signed-off-by:Jithu Joseph <jithu.joseph@intel.com> Reviewed-by:
Tony Luck <tony.luck@intel.com> Reviewed-by:
Ashok Raj <ashok.raj@intel.com> Reviewed-by:
Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com> Link: https://lore.kernel.org/r/20240412172349.544064-2-jithu.joseph@intel.com Reviewed-by:
Hans de Goede <hdegoede@redhat.com> Signed-off-by:
Hans de Goede <hdegoede@redhat.com> [ Aichun Shi: amend commit log ] Signed-off-by:
Aichun Shi <aichun.shi@intel.com>