Commit 1abc8966 authored by Meenakshi Aggarwal's avatar Meenakshi Aggarwal Committed by Herbert Xu
Browse files

crypto: caam - optimize RNG sample size



TRNG "sample size" (the total number of entropy samples that will be taken
during entropy generation) default / POR value is very conservatively
set to 2500.

Let's set it to 512, the same as the caam driver in U-boot
(drivers/crypto/fsl_caam.c) does.

This solves the issue of RNG performance dropping after a suspend/resume
cycle on parts where caam loses power, since the initial U-boot setttings
are lost and kernel does not restore them when resuming.

Note: when changing the sample size, the self-test parameters need to be
updated accordingly.

Signed-off-by: default avatarHoria Geantă <horia.geanta@nxp.com>
Signed-off-by: default avatarMeenakshi Aggarwal <meenakshi.aggarwal@nxp.com>
Reviewed-by: default avatarGaurav Jain <gaurav.jain@nxp.com>
Signed-off-by: default avatarHerbert Xu <herbert@gondor.apana.org.au>
parent 2be0d806
Loading
Loading
Loading
Loading
+32 −20
Original line number Diff line number Diff line
@@ -358,7 +358,7 @@ static void kick_trng(struct device *dev, int ent_delay)
	struct caam_drv_private *ctrlpriv = dev_get_drvdata(dev);
	struct caam_ctrl __iomem *ctrl;
	struct rng4tst __iomem *r4tst;
	u32 val;
	u32 val, rtsdctl;

	ctrl = (struct caam_ctrl __iomem *)ctrlpriv->ctrl;
	r4tst = &ctrl->r4tst[0];
@@ -374,26 +374,38 @@ static void kick_trng(struct device *dev, int ent_delay)
	 * Performance-wise, it does not make sense to
	 * set the delay to a value that is lower
	 * than the last one that worked (i.e. the state handles
	 * were instantiated properly. Thus, instead of wasting
	 * time trying to set the values controlling the sample
	 * frequency, the function simply returns.
	 * were instantiated properly).
	 */
	val = (rd_reg32(&r4tst->rtsdctl) & RTSDCTL_ENT_DLY_MASK)
	      >> RTSDCTL_ENT_DLY_SHIFT;
	if (ent_delay <= val)
		goto start_rng;

	val = rd_reg32(&r4tst->rtsdctl);
	val = (val & ~RTSDCTL_ENT_DLY_MASK) |
	      (ent_delay << RTSDCTL_ENT_DLY_SHIFT);
	wr_reg32(&r4tst->rtsdctl, val);
	rtsdctl = rd_reg32(&r4tst->rtsdctl);
	val = (rtsdctl & RTSDCTL_ENT_DLY_MASK) >> RTSDCTL_ENT_DLY_SHIFT;
	if (ent_delay > val) {
		val = ent_delay;
		/* min. freq. count, equal to 1/4 of the entropy sample length */
	wr_reg32(&r4tst->rtfrqmin, ent_delay >> 2);
		wr_reg32(&r4tst->rtfrqmin, val >> 2);
		/* max. freq. count, equal to 16 times the entropy sample length */
	wr_reg32(&r4tst->rtfrqmax, ent_delay << 4);
	/* read the control register */
	val = rd_reg32(&r4tst->rtmctl);
start_rng:
		wr_reg32(&r4tst->rtfrqmax, val << 4);
	}

	wr_reg32(&r4tst->rtsdctl, (val << RTSDCTL_ENT_DLY_SHIFT) |
		 RTSDCTL_SAMP_SIZE_VAL);

	/*
	 * To avoid reprogramming the self-test parameters over and over again,
	 * use RTSDCTL[SAMP_SIZE] as an indicator.
	 */
	if ((rtsdctl & RTSDCTL_SAMP_SIZE_MASK) != RTSDCTL_SAMP_SIZE_VAL) {
		wr_reg32(&r4tst->rtscmisc, (2 << 16) | 32);
		wr_reg32(&r4tst->rtpkrrng, 570);
		wr_reg32(&r4tst->rtpkrmax, 1600);
		wr_reg32(&r4tst->rtscml, (122 << 16) | 317);
		wr_reg32(&r4tst->rtscrl[0], (80 << 16) | 107);
		wr_reg32(&r4tst->rtscrl[1], (57 << 16) | 62);
		wr_reg32(&r4tst->rtscrl[2], (39 << 16) | 39);
		wr_reg32(&r4tst->rtscrl[3], (27 << 16) | 26);
		wr_reg32(&r4tst->rtscrl[4], (19 << 16) | 18);
		wr_reg32(&r4tst->rtscrl[5], (18 << 16) | 17);
	}

	/*
	 * select raw sampling in both entropy shifter
	 * and statistical checker; ; put RNG4 into run mode
+12 −2
Original line number Diff line number Diff line
@@ -3,7 +3,7 @@
 * CAAM hardware register-level view
 *
 * Copyright 2008-2011 Freescale Semiconductor, Inc.
 * Copyright 2018 NXP
 * Copyright 2018, 2023 NXP
 */

#ifndef REGS_H
@@ -523,6 +523,8 @@ struct rng4tst {
#define RTSDCTL_ENT_DLY_MASK (0xffff << RTSDCTL_ENT_DLY_SHIFT)
#define RTSDCTL_ENT_DLY_MIN 3200
#define RTSDCTL_ENT_DLY_MAX 12800
#define RTSDCTL_SAMP_SIZE_MASK 0xffff
#define RTSDCTL_SAMP_SIZE_VAL 512
	u32 rtsdctl;		/* seed control register */
	union {
		u32 rtsblim;	/* PRGM=1: sparse bit limit register */
@@ -534,7 +536,15 @@ struct rng4tst {
		u32 rtfrqmax;	/* PRGM=1: freq. count max. limit register */
		u32 rtfrqcnt;	/* PRGM=0: freq. count register */
	};
	u32 rsvd1[40];
	union {
		u32 rtscmc;	/* statistical check run monobit count */
		u32 rtscml;	/* statistical check run monobit limit */
	};
	union {
		u32 rtscrc[6];	/* statistical check run length count */
		u32 rtscrl[6];	/* statistical check run length limit */
	};
	u32 rsvd1[33];
#define RDSTA_SKVT 0x80000000
#define RDSTA_SKVN 0x40000000
#define RDSTA_PR0 BIT(4)